FORCE Technology has taken a giant step into future technology by investing in a state of the art microscope for almost DKK 10 million.
It is a Scanning Electron Microscope (SEM) with Focused Ion Beam (FIB) opening up to whole new possibilities within surface analysis, characterising and proto typing under the 100 nanometres level. The microscope examines all material types such as metals, polymers and glass.
Without damaging the material structure it is now possible to perform in-depth profiles into the material and thus gather new knowledge on the material characteristics and properties. The equipment’s “nano-saw” may also be used to carry out advanced test preparations for transmission electron microscopes.
Further information:
Please contact Jacob Markussen, tel. (+45) 43 26 72 57.
